НЕВЛЮДОВ, И. Ш.; ЖАРИКОВА, И. В.; ПЕРЕПЕЛИЦА, И. Д.; РЕЗНИЧЕНКО, А. Г. The analysis of the electronic devices substrates roughness testing methods. Eastern-European Journal of Enterprise Technologies, [S. l.], v. 2, n. 5(68), p. 25–30, 2014. DOI: 10.15587/1729-4061.2014.21864. Disponível em: http://journals.uran.ua/eejet/article/view/21864. Acesso em: 29 jan. 2023.