НОВОСЯДЛИЙ, С. П.; ВІВЧАРУК, В. М. Ellipsometry in submicronic technology of formation of GIC structures. Eastern-European Journal of Enterprise Technologies, [S. l.], v. 3, n. 7(45), p. 8–17, 2010. DOI: 10.15587/1729-4061.2010.2856. Disponível em: https://journals.uran.ua/eejet/article/view/2856. Acesso em: 19 apr. 2024.