Новосядлий, Степан Петрович, and Володимир Михайлович Вівчарук. “Ellipsometry in Submicronic Technology of Formation of GIC Structures”. Eastern-European Journal of Enterprise Technologies 3, no. 7(45) (May 28, 2010): 8–17. Accessed April 19, 2024. https://journals.uran.ua/eejet/article/view/2856.