Невлюдов ИШ, Жарикова ИВ, Перепелица ИД, Резниченко АГ. The analysis of the electronic devices substrates roughness testing methods. EEJET [Internet]. 2014Apr.15 [cited 2024Apr.19];2(5(68):25-30. Available from: https://journals.uran.ua/eejet/article/view/21864