The evaluation of diagnostical properties of March_DSS ram test

Authors

  • Татьяна Юрьевна Потопахина National Technical University "Kharkiv Polytechnic Institute" st. Frunze, 21, Kharkov, Ukraine, 61002, Ukraine
  • Игорь Геннадиевич Либерг National Technical University "Kharkiv Polytechnic Institute" st. Frunze, 21, Kharkov, Ukraine, 61002, Ukraine
  • Алина Юрьевна Попова Национальный техничский университет «Харьковский политехнический институт» ул. Фрунзе, 21 , г. Харьков , Украина, 61002, Ukraine
  • Алина Юрьевна Попова National Technical University "Kharkiv Polytechnic Institute" st. Frunze, 21, Kharkov, Ukraine, 61002, Ukraine
  • Алина Игоревна Сивальнева National Technical University "Kharkiv Polytechnic Institute" st. Frunze, 21, Kharkov, Ukraine, 61002, Ukraine

DOI:

https://doi.org/10.15587/2313-8416.2014.34596

Keywords:

RAM faults, March test sequences, evaluation of diagnostic opportunities

Abstract

Researches of diagnostic ability of test sequence March_ DSS for detection of failure of a random access memory are offered. Analysis results of the March_ DSS test in comparison with other algorithms of check regarding detection of the multiple failures are provided. The recommendations are offered for use of investigated test sequences.

Author Biographies

Татьяна Юрьевна Потопахина, National Technical University "Kharkiv Polytechnic Institute" st. Frunze, 21, Kharkov, Ukraine, 61002

Department of Automation and Control in Engineering Systems

Игорь Геннадиевич Либерг, National Technical University "Kharkiv Polytechnic Institute" st. Frunze, 21, Kharkov, Ukraine, 61002

PhD, Associate Professor

Department of Automation and Control in Engineering Systems

Алина Юрьевна Попова, Национальный техничский университет «Харьковский политехнический институт» ул. Фрунзе, 21 , г. Харьков , Украина, 61002

Кафедра автоматики и управления в технических системах

Алина Юрьевна Попова, National Technical University "Kharkiv Polytechnic Institute" st. Frunze, 21, Kharkov, Ukraine, 61002

Department of Automation and Control in Engineering Systems

Алина Игоревна Сивальнева, National Technical University "Kharkiv Polytechnic Institute" st. Frunze, 21, Kharkov, Ukraine, 61002

Department of Automation and Control in Engineering Systems

References

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Patent N20090199057A1 USA, Int.Cl.G11 C29/00 (2009). March DSS: Memory Diagnostic Test. Publ. 06.08.2009.

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van de Goor, A. J. (1998). Testing Semiconductor Memories. Theory and Practice. ComTex Publushing, Gouda, The Netherlands, 512.

Libergb, I. G., Bovkun, D. N. (2004). Issledovanie obnaruzhivajushhej sposobnosti algoritmov proverki operativnoj pamjati. Vestnik NTU ”KhPI”, 17, 127–137.

Published

2014-12-25

Issue

Section

Physics and mathematics