Measurement of electrophysical properties in the Landauer-Datta-Lundstrom transport model

Authors

  • Юрій Олексійович Кругляк Odessa State Environmental University, Ukraine

DOI:

https://doi.org/10.15587/2313-8416.2015.40155

Keywords:

nanophysics, nanoelectronics, resistance measurement, van der Pauw method, Hall effect, thermal measurement, artifact measurement, Nernst effect, Shubnikov effect

Abstract

Experimental methods of measuring the resistance in the frame of the LDL model, including measurements under applied external magnetic field are discussed, namely: method of variable resistor length, four-point measurement scheme, the classical method of the Hall effect measurement and different variants of the van der Pauw method, temperature measurements and accounting for artifacts (Nernst effect), measurements in strong magnetic fields(Shubnikov–deHaaseffect). 

Author Biography

Юрій Олексійович Кругляк, Odessa State Environmental University

Doctor of Chemical Sciences, Professor

Department of Information Technologies

References

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Published

2015-04-27

Issue

Section

Physics and mathematics