Самойлов, А.Н. and Шевченко, И.В. 2015. Methods for recovering the dislocations contour line of gallium arsenide wafer of digital image. Eastern-European Journal of Enterprise Technologies. 3, 5(75) (Jun. 2015), 8–16. DOI:https://doi.org/10.15587/1729-4061.2015.43326.