YAREMIY, I.; YAREMIY, S.; POVKH, M.; VLASII, O.; FEDORIV, V.; Luсas A. X-­ray diagnostics of the structure of near­surface layers of ion­implanted monocrystalline materials. Eastern-European Journal of Enterprise Technologies, [S. l.], v. 6, n. 12 (96), p. 50–57, 2018. DOI: 10.15587/1729-4061.2018.151806. Disponível em: https://journals.uran.ua/eejet/article/view/151806. Acesso em: 17 jul. 2024.