DUNETS, R.; DZUNDZA, B.; DEICHAKIVSKYI, M.; MANDZYUK, V.; TERLETSKY, A.; POPLAVSKYI, O. Methods of computer tools development for measuring and analysis of electrical properties of semiconductor films. Eastern-European Journal of Enterprise Technologies, [S. l.], v. 1, n. 9 (103), p. 32–38, 2020. DOI: 10.15587/1729-4061.2020.195253. Disponível em: https://journals.uran.ua/eejet/article/view/195253. Acesso em: 23 nov. 2024.