САМОЙЛОВ, А. Н.; ШЕВЧЕНКО, И. В. Methods for recovering the dislocations contour line of gallium arsenide wafer of digital image. Eastern-European Journal of Enterprise Technologies, [S. l.], v. 3, n. 5(75), p. 8–16, 2015. DOI: 10.15587/1729-4061.2015.43326. Disponível em: https://journals.uran.ua/eejet/article/view/43326. Acesso em: 24 dec. 2024.