VELYCHKO, O.; SHEVKUN, S. Support of metrological traceability of capacitance measurements in Ukraine. Eastern-European Journal of Enterprise Technologies, [S. l.], v. 3, n. 9 (87), p. 4–10, 2017. DOI: 10.15587/1729-4061.2017.101897. Disponível em: https://journals.uran.ua/eejet/article/view/101897. Acesso em: 2 may. 2024.