PAGAVA, T.; CHKHARTISHVILI, L.; MAISURADZE, N.; ESIAVA, R.; DEKANOSIDZE, S.; BERIDZE, M.; MAMISASHVILI, N. Role of boron in formation of secondary radiation defects in silicon. Eastern-European Journal of Enterprise Technologies, [S. l.], v. 4, n. 5(76), p. 52–58, 2015. DOI: 10.15587/1729-4061.2015.47224. Disponível em: https://journals.uran.ua/eejet/article/view/47224. Acesso em: 5 may. 2024.