Pagava, T., Chkhartishvili, L., Maisuradze, N., Esiava, R., Dekanosidze, S., Beridze, M. and Mamisashvili, N. (2015) “Role of boron in formation of secondary radiation defects in silicon”, Eastern-European Journal of Enterprise Technologies, 4(5(76), pp. 52–58. doi: 10.15587/1729-4061.2015.47224.