Воробець, Марія Михайлівна. “Investigation of Stability of Electrophysical Parameters of Si-Wafers before Forming Porous Layer”. Eastern-European Journal of Enterprise Technologies 6, no. 12(60) (December 26, 2012): 50–52. Accessed July 18, 2024. https://journals.uran.ua/eejet/article/view/6032.