Dunets, Roman, Bogdan Dzundza, Mykhailo Deichakivskyi, Volodymyr Mandzyuk, Andrii Terletsky, and Omelian Poplavskyi. “Methods of Computer Tools Development for Measuring and Analysis of Electrical Properties of Semiconductor Films”. Eastern-European Journal of Enterprise Technologies 1, no. 9 (103) (February 29, 2020): 32–38. Accessed May 19, 2024. https://journals.uran.ua/eejet/article/view/195253.