NEVLIUDOV, I.; GURIN, V.; GURIN, D. METHODS OF FAILURE DIAGNOSTICS OF TANTALUM OXIDE-SEMICONDUCTOR CAPACITORS WITH SOLID DIELECTRIC. INNOVATIVE TECHNOLOGIES AND SCIENTIFIC SOLUTIONS FOR INDUSTRIES, [S. l.], n. 4 (6), p. 57–61, 2018. DOI: 10.30837/2522-9818.2018.6.057. Disponível em: https://journals.uran.ua/itssi/article/view/2522-9818.2018.6.057. Acesso em: 20 oct. 2024.