BADANYUK, I.; NEVLIUDOV, I.; NIKITIN, D. TOPOLOGICAL IMAGE PROCESSING FOR COMPREHENSIVE DEFECT AND DEVIATION ANALYSIS USING ADAPTIVE BINARISATION. INNOVATIVE TECHNOLOGIES AND SCIENTIFIC SOLUTIONS FOR INDUSTRIES, [S. l.], n. 1 (23), p. 164–173, 2023. DOI: 10.30837/ITSSI.2023.23.164. Disponível em: https://journals.uran.ua/itssi/article/view/277316. Acesso em: 17 aug. 2024.