Nevliudov, Igor, Valeriy Gurin, and Dmytro Gurin. 2018. “METHODS OF FAILURE DIAGNOSTICS OF TANTALUM OXIDE-SEMICONDUCTOR CAPACITORS WITH SOLID DIELECTRIC”. INNOVATIVE TECHNOLOGIES AND SCIENTIFIC SOLUTIONS FOR INDUSTRIES, no. 4 (6) (December):57-61. https://doi.org/10.30837/2522-9818.2018.6.057.