Badanyuk I, Nevliudov I, Nikitin D. TOPOLOGICAL IMAGE PROCESSING FOR COMPREHENSIVE DEFECT AND DEVIATION ANALYSIS USING ADAPTIVE BINARISATION. ITSSI [Internet]. 2023Apr.21 [cited 2024Aug.17];(1 (23):164-73. Available from: https://journals.uran.ua/itssi/article/view/277316