MELNYK, R.; KVIT, R. Measurement of material surface defect intensity by distributed cumulative histogram and clustering. Technology audit and production reserves, [S. l.], v. 4, n. 2(54), p. 36–45, 2020. DOI: 10.15587/2706-5448.2020.210151. Disponível em: https://journals.uran.ua/tarp/article/view/210151. Acesso em: 18 may. 2024.