КРАВЧЕНКО, О. В. Reliability prediction of discrete devices by modeling the process of material degradation. Technology audit and production reserves, [S. l.], v. 1, n. 2(21), p. 57–60, 2015. DOI: 10.15587/2312-8372.2015.37697. Disponível em: https://journals.uran.ua/tarp/article/view/37697. Acesso em: 27 feb. 2024.