Самойлов, Андрей Николаевич, and Игорь Васильевич Шевченко. “Development of Methods for Separation of Binarized Fragments of Etching Pits of Semiconductor Wafer”. Technology audit and production reserves 3, no. 1(29) (May 26, 2016): 60–68. Accessed December 24, 2024. https://journals.uran.ua/tarp/article/view/71988.