Еllipsometric studies of homogeniouly of As<sub>2</sub>S<sub>3</sub> chalcogenid glass thin films

Authors

  • В. М. Жихарєв Uzhgorod National University, Ukraine
  • М. І. Козак Uzhgorod National University, Ukraine
  • І. Д. Сейковський Uzhgorod National University, Ukraine

DOI:

https://doi.org/10.24144/2415-8038.2004.16.59-66

Keywords:

Uniform isotropic film model, Variable thickness film model, Ellipsometric measurements, Optical constants

Abstract

In the framework of two approaches – a uniform isotropic film model and a variable thickness film model optical constants of glassy As2S3 thin films of different thickness were calculated on the basis of ellipsometric measurements. The second method is shown to be more adequate.

References

М.Борн, Э.Вольф, Основы оптики (Наука, Москва, 1973).

Р.Аззам, Н.Башара, Эллипсометрия и поляризованный свет (Мир, Москва, 1981).

В.М. Жихарєв, М.І. Козак, М.Ю. Бобик, І.Д. Сейковський, Вісник Ужгородського університету. Сер. Фізика, в. 15, 2004.

I. Ohlidal, D. Franta, M. Frumar, J. Jedelsky, J. Omasta, JOAM, 2004.

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Published

2004-12-31

Issue

Vol. 16 (2004)

Section

Статті

License

Copyright (c) 2004 Scientific Herald of Uzhhorod University.Series Physics

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