Effect of temperature on the reflective index dispersion of As<sub>X</sub>S<sub>1−X</sub> glasses

Authors

  • І. Й. Росола Uzhhorod National University, Ukraine
  • О. І. Чобаль Uzhhorod National University, Ukraine
  • В. М. Різак Uzhhorod National University, Ukraine

DOI:

https://doi.org/10.24144/2415-8038.2019.46.30-39

Keywords:

Glassy, Synthesis, Refraction, Refractive index, Single-oscillator model, Energy of electronic oscillator, Dispersion energy, Polarizability coefficient

Abstract

Purpose. The purpose of this research was to prepare AsXS1X glasses and to study concentration and temperature dependences of their refractive index.

Methods. The refractive index was measured by a prism method. Plane parallel slabs with thicknesses of 1 mm were cut from synthesized bulk samples. The sample prisms had refracting faces with areas of 5 × 10 mm and angles between them of 10° – 15°. The refracting angles of the prisms were determined on a LOMO G-1.5 goniometer. The temperature was measured with a copper-constantan thermocouple to within ±0.5 K. The error in the refractive index n over the entire observed spectral range was ±2 · 10–4.

Results. The dispersion of the refractive index n(λ) of AsXS1X glasses was studied in the concentration range from X = 0.20 to X = 0.40 of five samples in the temperature range from 80 to 370 K at wavelengths from 1.0 μm to 2.3 μm. It was found that the refractive index of the studied materials n at a fixed wavelength λ decreases with increasing temperature, dn/dT = 1, 2… 10, 5 · 105 K1 depending on the composition.

Conclusions. The experimental results of n(λ) of AsXS1X glasses were described in terms of the Wemple – DiDomenico single effective oscillator model. Based on the experimental results, atomic refractions and the polarizability coefficient of glasses of the AsXS1X system were calculated, and their temperature behavior and concentration dependence were explained. It was concluded that thermal expansion coefficient makes the main contribution to the value of the temperature dependence of the refractive index.

References

Batsanov, S.S. (1979), Structural refractometry [Strukturnaya refraktometriya], Vysshaya shkola, Moscow, 302 p.

Rosola, I.Y. (1985), Investigation of the structure of glassy semiconductors of the Ge-As-S-I system using IR and Raman spectroscopy: Author’s thesis [Issledovaniye struktury stekloobraznykh poluprovodnikov sistemy Ge-As-S-I metodami IK- i KR- spektroskopii: avtoref. dis. ... Kand. fiz.-mat. Nauk], Kishinev, 20 p.

Rosola, I.Y., Levko, I.V (2013), “The dispersion properties of glasses AsXS1−X” [Dyspersiyni vlastyvosti stekol AsXS1−X], Uzhhorod University Scientific Herald. Series Physics [Nauk. Visn. Uzhhorod. Univ. Ser. Fiz.], Iss. 33, pp. 110–116

Adam, J. L., Zhang X. (2014), Chalcogenide glasses: preparation, properties and applications, Woodhead publishing, 704 P.

Zakery, A., & Elliott, S. R. (2003). Optical properties and applications of chalcogenide glasses: a review. Journal of Non-Crystalline Solids, 330(1-3), 1-12.

Zhang, X., Ma, H., & Lucas, J. (2003). Applications of chalcogenide glass bulks and fibres. J. Optoelectron. Adv. Mater, 5(5), 1327-1333.

Tsiulyanu, Д., Marian, S., Liess, H. L., & Eisele, І. (2003). Chalcogenide based gas sensors. J. of Optoelec. and Advanc. Mat, 5(5), 1349-1354.

Rosola, I.I., Puga, P.P., Chepur, D.V. (1981), “The reduced density of vibrational states and structural features in glasses of the As-S system” [Privedennaya plotnost’ kolebatel’nykh sostoyaniy i strukturnyye osobennosti v steklakh sistemy As-S], Complex semiconductors (production, properties, application) [Slozhnyye poluprovodniki (polucheniye, svoystva, primeneniye)], Uzhgorod University Publishing, pp. 83–92.

Khiminets, V.V., Pynzenyk, V.P., Khiminets, O.V. (1982), New glassy semiconductors for optoelectronics [Novyye stekloobraznyye poluprovodniki dlya optoelektroniki], Prospect of the Exhibition of Economic Achievements of the USSR [Prospekt VDNKH SSSR], Uzhgorod, 7 p.

Khiminets, V.V., Pynzenyk, V.P., et.al (1983), “Chalcogenide glasses in the Ge-As-S-J system” [Khal’kogenidnyye stekla v sisteme Ge-As-S-J], Information leaflet on scientific and technological achievement [Informatsionnyy listok o nauchno-tekhnicheskom dostizhenii], Publishing house of Lviv INTI, Lviv, 4 p.

Rizak, V. M., Rizak, I.M., Semak, D.G. (2001) Functional Chalcogenide Semiconductors [Funktsionalʹni khalʹkohenidni napivprovidnyky], Transcarpathia, Uzhhorod, 152 p.

Puga, P.P., Kovach, D.Sh., Zuban, V.A., Borets A.N. (1984), “Temperature refractometric unit based on the optical dividing head ODG-10” [Temperaturnaya refraktometricheskaya ustanovka na baze opticheskoy delitel’noy golovki ODG-10], Metrological support of production and instrumentation [Metrologicheskoye obespecheniye proizvodstva i kontrol’noizmeritel’nayatekhnika], Uzhgorod, pp. 43–47

Ioffe, B.T. (1974), Refractometric chemistry methods. 2nd ed. [Refraktometrichesiye metody khimii. 2-ye izd.], Chemistry, Leningrad, 400 p.

Moss, T. (1961), Optical properties of semiconductors [Opticheskiye svoystva poluprovodnikov], Foreign Literature Publishing House, Moscow, 304 p.

Wemple, S.H., Di Domenico, M. (1971), “Behavior of the dielectric constant in covalent and ionic materials”, Phys. Rev. B., V. 3, No. 4, pp. 1338–1352.

Wemple, S.H. (1973), “Refractive-index behavior of amorphous semiconductors and glass”, Phys. Rev. B., V. 7, No. 8, pp. 3767–3777.

Prod’homme, L. (1960), “A new approach to the thermal change in the refractive index of glasses”, Phys. Chem. Glasses, No. 1, pp. 119–122.

Published

2019-12-31

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