Static and dynamic mathematical models of roughness of extended surfaces


  • Иван Владимирович Мирошниченко National Technical University of Ukraine "Kyiv Polytechnic Institute", Peremogy prospect, 37, Kyiv, 03056, Ukraine



static mathematical model, dynamic mathematical model, roughness, undulation


In this article it is discussed the possibility of forming a mathematical model (MM) of undulation as a dynamic model of roughness by measuring the roughness profile ordinates and calculate its static characteristics for simple surfaces.

The main goal of the research is to develop methods for improve the accuracy of the experimental data processing systems (EDPS) with integrated software controlled adaptive channels (SCAC) based on analog inductive contact sensors (ICS) with extended measurement range of roughness ordinates resistant to impact load and the influence of external magnetic fields.

The basic invariants for adaptive EDPS of quality control (EDPS-C) at change of condition are the total error as the defining quality index of EDPS-C and optimization programs that implement methods to improve accuracy.

In the article it is discussed one of the methods of improving the accuracy of analog-digital EDPS-C with integrated SCAC consisting in estimation the algorithm for calculating of the central moments of static MM of roughness by introducing the table correction coefficient, which allows to adapt the EDPS-C.

Due to the shown possibility of MM forming of undulation as dynamic MM of roughness can calculate its static characteristics for simple surfaces by measuring the ordinates of roughness profiles of ICS moving on independent linear basis.

Author Biography

Иван Владимирович Мирошниченко, National Technical University of Ukraine "Kyiv Polytechnic Institute", Peremogy prospect, 37, Kyiv, 03056

Senior Lecturer

Department of design automation of energy processes and systems


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How to Cite

Мирошниченко, И. В. (2015). Static and dynamic mathematical models of roughness of extended surfaces. Technology Audit and Production Reserves, 1(2(21), 31–34.



Information Technologies: Original Research