Development of intelligent subsystem for reliability forecasting of discrete devices «FORECAST»

Authors

DOI:

https://doi.org/10.15587/2312-8372.2016.80770

Keywords:

reliability, discrete device, intelligent forecasting system, block diagram

Abstract

This article focuses on the process of developing intelligent subsystem for reliability forecasting of discrete devices «FORECAST». Created system enables according to the physical characteristics to perform analysis of discrete device to predict the reliability of its work in time.

Reliability forecasting of the discrete devices taking into account interphase layer will allow without financial and time costs accurately answer the question about depending a reliability of discrete unit on area interphase layer formed by the interaction of two basic materials of discrete device element.

The disadvantage of created system can be considered a necessity of its setting for separate type of discrete device. Later, this disadvantage will be eliminated by creating libraries of parameters.

Software implementation of intelligent subsystem for reliability forecasting of discrete devices allowed to implement a method of forecasting technical condition of discrete device on the basis of proposed model by taking into account the physical properties of composite materials. Set of the reliability function values is obtained during the test of discrete device elements.

Verification of the results of intelligent subsystem for reliability forecasting «FORECAST» based on the physical condition of discrete devices is conducted to assess the working capacity of electronic control unit of the car system.

Accuracy of the results of the reliability values using the method of reliability forecasting of discrete devices based on modeling the degradation process of computer components is 7 %.

The workers of technical section spent 5 % more time to diagnostics by hardware maintenance compared with the time of application of intelligent subsystem for reliability forecasting «FORECAST».

Author Biography

Ольга Віталіївна Кравченко, Cherkasy State Technological University, 460 Shevchenko str., Cherkasy, 18006

Senior Lecturer

Department of Information Technology Design

References

  1. Kripiakevich, P. I. (1977). Strukturnye tipy intermetallicheskih soedinenii. Moscow: Nauka, 290.
  2. Tareev, B. M. (1982). Fizika dielektricheskih materialov. Moscow: Energiia, 320.
  3. Kapur, K. C., Lamberson, L. R.; Translated from English: Kovalenko, E. G.; In: Ushakov, I. A. (1980). Reliability in Engineering Design. Moscow: Mir, 604.
  4. Gotra, Z. Yu., Nikolaev, I. M. (1978). Kontrol' kachestva i nadezhnost' mikroshem. Moscow: Radio i sviaz, 168.
  5. Kuts, Yu. V., Reutskyi, Ye. A., Shcherbak, L. M. (2011). Zadachi prohnozuvannia metrolohichnoi nadiinosti vymiriuvalnykh zasobiv. Zbirnyk naukovykh prats Instytutu problem modeliuvannia v enerhetychnii nadiinosti vymiriuvalnykh zasobiv im. H. Ye. Pukhova NANU, Vol. 61, 53–59.
  6. Eremenko, V. S., Pereidenko, A. V. (2012, August 31). Software of Information-Measurement System for Standardless Diagnostic of Composite Materials. International Journal of Software Engineering, Vol. 2, № 3, 65–76. doi:10.5923/j.se.20120203.04
  7. Shulzhenko, M. H., Yefremov, Yu. H., Tsybulko, V. Y., Deparma, O. V. (2016). Rozrobka mobilnoho bahatofunktsionalnoho vymiriuvalno-diahnostychnoho kompleksu neruinivnoho kontroliu i otsinky tekhnichnoho stanu enerhetychnykh i transportnykh ahrehativ tryvaloi ekspluatatsii. Tehnicheskaia diagnostika i nerazrushaiushchii kontrol, 1, 32–38.
  8. Kravchenko, O. (2015). Research the causes of degradation of the material discrete devices to ensure their reliable. Proceedings of the International Conference «Computational Intelligence (Results, Problems and Perspectives)», May 12-15, 2015, Kyiv-Cherkasy, Ukraine. Cherkasy, 283–284. ISBN 978-966-493-975-8.
  9. Kravchenko, O. (2015). Reliability prediction of discrete devices by modeling the process of material degradation. Technology Audit And Production Reserves, 1(2(21)), 57–60. doi:10.15587/2312-8372.2015.37697
  10. Kravchenko, O. (2015). Degradation process simulation of computer components of discrete devices. Technology Audit And Production Reserves, 5(2(25)), 23–26. doi:10.15587/2312-8372.2015.51795
  11. Lee, H., Cho, S. W., Yi, Y. (2016, December). Interfacial electronic structure for high performance organic devices. Current Applied Physics, Vol. 16, № 12, 1533–1549. doi:10.1016/j.cap.2016.09.009
  12. Natali, M., Kenny, J. M., Torre, L. (2016, December). Science and technology of polymeric ablative materials for thermal protection systems and propulsion devices: A review. Progress in Materials Science, Vol. 84, 192–275. doi:10.1016/j.pmatsci.2016.08.003
  13. Li, S., Ren, Y., Biswas, P., Tse, S. D. (2016, July). Flame aerosol synthesis of nanostructured materials and functional devices: Processing, modeling, and diagnostics. Progress in Energy and Combustion Science, Vol. 55, 1–59. doi:10.1016/j.pecs.2016.04.002
  14. Kheradmand, R., Aghdami, K. M., Talouneh, K. (2016, October). The switching of dark and bright soliton in 1D discrete cavity laser. Chaos, Solitons & Fractals, Vol. 91, 511–515. doi:10.1016/j.chaos.2016.07.005
  15. Kheradmand, R., Aghdami, K. M., Talouneh, K. (2016, October). The switching of dark and bright soliton in 1D discrete cavity laser. Chaos, Solitons & Fractals, Vol. 48, № 2, 372–382. doi:10.1016/j.chaos.2016.07.005
  16. Dumas, J. M., Paugam, J., LeMouellic, C., Boulaire, J. Y. (1983). Long Term Degradation of GaAs Power MESFET’s Induced by Surface Effects. 21st International Reliability Physics Symposium, Phoenix, Arizona, April 5-7, 1983. New York: Institute of Electrical and Electronics Engineers (IEEE), 226–228.
  17. Baliga, B. J., Ehle, R., Sears, A., Campbell, P., Garwacki, W., Katz, W. (1982, July). Breakdown stability of gold, aluminum, and tungsten Schottky barriers on gallium arsenide. IEEE Electron Device Letters, Vol. 3, № 7, 177–179. doi:10.1109/edl.1982.25528

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Published

2016-09-29

How to Cite

Кравченко, О. В. (2016). Development of intelligent subsystem for reliability forecasting of discrete devices «FORECAST». Technology Audit and Production Reserves, 5(2(31), 53–58. https://doi.org/10.15587/2312-8372.2016.80770

Issue

Vol. 5 No. 2(31) (2016): Systems and control processes. Information and control systems. Technology Transfer in the Transport Industry

Section

Information Technologies: Original Research

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Copyright (c) 2016 Ольга Віталіївна Кравченко

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