Features kantilevernyh nanomechanical elements of atomic-force microscope

Authors

  • Николай Юрьевич Гетманенко Харьковский национальный университет радиоэлектроники пр. Ленина, 14, г. Харьков, Украина 61000, Ukraine

DOI:

https://doi.org/10.15587/1729-4061.2011.1438

Keywords:

Atomic force microscope, cantilever, biosensor, deformation

Abstract

This study focuses on the processes of deformation, resulting in the cantilever of an atomic force microscope. The mathematical models describing the deformation of the cantilever in space depending on the magnitude and direction of external forces are developed

Author Biography

Николай Юрьевич Гетманенко, Харьковский национальный университет радиоэлектроники пр. Ленина, 14, г. Харьков, Украина 61000

Аспирант

Кафедра биомедицинской электроники

References

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  4. Handbook of Micro/Nanotribology [Текст] / Ed. by Bhushan Bharat. - 2d ed. - Boca Raton etc.: CRC press, 1999. – 859 c.
  5. Тимошенко, С.П. Сопротивление материалов. Т. 1. Элементарная теория и задачи: учеб, пособие [Текст] / С.П. Тимошенко — 2-е изд., перераб. — М.: Наука, 1965. — 364 с.
  6. Феодосьев, В.И. Избранные задачи и вопросы по сопротивлению материалов: учеб, пособие [Текст] / В.И. Феодосьев. — М.: Наука, 1967. — 327 с.
  7. Тимошенко, С.П. Сопротивление материалов. Т. 2. Более сложные вопросы теории и задачи: учеб, пособие [Текст] / С.П. Тимошенко — 2-е изд., перераб. — М.: Наука, 1965. — 480 с.

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How to Cite

Гетманенко, Н. Ю. (2011). Features kantilevernyh nanomechanical elements of atomic-force microscope. Eastern-European Journal of Enterprise Technologies, 4(7(52), 30–35. https://doi.org/10.15587/1729-4061.2011.1438

Issue

Vol. 4 No. 7(52) (2011): Applied mechanics

Section

Applied mechanics

License

Copyright (c) 2014 Николай Юрьевич Гетманенко

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