DETERMINATION OF OPTICAL PROPERTIES OF THIN FILMS ТІО2 BY THE INSTRUMENTALITY OF CONVERTING METHOD
DOI:
https://doi.org/10.15587/1729-4061.2010.3149Keywords:
TiO2, magnetron, optical propertiesAbstract
The envelope method was employed to determine the thickness and optical properties of the TiO2 thin film deposited by DC reactive magnetron sputtering. The titanium dioxide thin film was established to be an indirect semiconductor with the band gap energy Eg=3.15 еВ.References
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