Гордієнко Тетяна Богданівна

Державне підприємство “Всеукраїнський державний науково-виробничий центр стандартизації, метрології, сертифікації та захисту прав споживачів” (ДП “Укрметртестстандарт”), Україна
Доктор технічних наук, професор
Науково-технічний інститут національної метрологічної служби України

Scopus profile: link
Researcher ID: A-1649-2015
ID ORCID: https://orcid.org/0000-0003-0324-9672

Основні публікації:

  1. Gordiyenko, T., Velychko, O. (2025). The role and tasks of National Metrological Institutions in regular training of metrologists. Measurement: Sensors, 38, 101326. https://doi.org/10.1016/j.measen.2024.101326 

  2. Velychko, O., Kuzmenko, I., Gordiyenko, T. (2025). Practical aspects of ensuring of the metrological traceability. Measurement: Sensors, 38, 101529. https://doi.org/10.1016/j.measen.2024.101529 

  3. Velychko, O., Kursin, S., Gordiyenko, T., Pototskyi, I. (2025). Peculiarities of formation and checking of the accreditation scope of calibration laboratory. Measurement: Sensors, 38, 101504. https://doi.org/10.1016/j.measen.2024.101504 

  4. Velychko, O., Shvedova, V., Gordiyenko, T. (2025). Estimation of long-term stability of precision inductance measures using different methods. Engineering Research Express, 7 (1), 015343. https://doi.org/10.1088/2631-8695/ad9432 

  5. Gordiyenko, T., Velychko, O., Salceanu, A. (2024). Regular Training of Metrologists for Electrical Measurements. 2024 IEEE International Conference And Exposition On Electric And Power Engineering (EPEi), 6–10. https://doi.org/10.1109/epei63510.2024.10758059 

  6. Velychko, O., Gordiyenko, T. (2023). Evaluation of the Long-Term Drift of Travelling Standard Between and During Comparisons. 2023 XXXIII International Scientific Symposium Metrology and Metrology Assurance (MMA). https://doi.org/10.1109/mma59144.2023.10317926 

  7. Velychko, O., Gordiyenko, T. (2023). Evaluation of the long-term drift of measuring instruments and standards using time series. Proceedings of the 26th IMEKO TC4 International Symposium and 24th International Workshop on ADC/DAC Modelling and Testing. https://doi.org/10.21014/tc4-2023.01