Tetyana Gordiyenko

State Enterprise “All-Ukrainian State Scientific and Production Centre for Standardization, Metrology, Certification and Protection of Consumer” (SE “Ukrmetrteststandard”), Ukraine
Doctor of Technical Sciences, Professor
Institute of the National Metrological Services of Ukraine

Scopus profile: link
Researcher ID: A-1649-2015
ID ORCID: https://orcid.org/0000-0003-0324-9672

Selected Publications:

  1. Gordiyenko, T., Velychko, O. (2025). The role and tasks of National Metrological Institutions in regular training of metrologists. Measurement: Sensors, 38, 101326. https://doi.org/10.1016/j.measen.2024.101326 

  2. Velychko, O., Kuzmenko, I., Gordiyenko, T. (2025). Practical aspects of ensuring of the metrological traceability. Measurement: Sensors, 38, 101529. https://doi.org/10.1016/j.measen.2024.101529 

  3. Velychko, O., Kursin, S., Gordiyenko, T., Pototskyi, I. (2025). Peculiarities of formation and checking of the accreditation scope of calibration laboratory. Measurement: Sensors, 38, 101504. https://doi.org/10.1016/j.measen.2024.101504 

  4. Velychko, O., Shvedova, V., Gordiyenko, T. (2025). Estimation of long-term stability of precision inductance measures using different methods. Engineering Research Express, 7 (1), 015343. https://doi.org/10.1088/2631-8695/ad9432 

  5. Gordiyenko, T., Velychko, O., Salceanu, A. (2024). Regular Training of Metrologists for Electrical Measurements. 2024 IEEE International Conference And Exposition On Electric And Power Engineering (EPEi), 6–10. https://doi.org/10.1109/epei63510.2024.10758059 

  6. Velychko, O., Gordiyenko, T. (2023). Evaluation of the Long-Term Drift of Travelling Standard Between and During Comparisons. 2023 XXXIII International Scientific Symposium Metrology and Metrology Assurance (MMA). https://doi.org/10.1109/mma59144.2023.10317926 

  7. Velychko, O., Gordiyenko, T. (2023). Evaluation of the long-term drift of measuring instruments and standards using time series. Proceedings of the 26th IMEKO TC4 International Symposium and 24th International Workshop on ADC/DAC Modelling and Testing. https://doi.org/10.21014/tc4-2023.01