Metrological traceability of impedance parameter measurements in Ukraine

Authors

  • Oleh Velychko State Enterprise “All-Ukrainian State Scientific and Production Centre for Standardization, Metrology, Certification and Protection of Consumer”, (SE “Ukrmetrteststandard”) Metrolohychna str., 4, Kyiv, Ukraine, 03143, Ukraine https://orcid.org/0000-0002-6564-4144
  • Sergii Shevkun State Enterprise “All-Ukrainian State Scientific and Production Centre for Standardization, Metrology, Certification and Protection of Consumer”, (SE “Ukrmetrteststandard”) Metrolohychna str., 4, Kyiv, Ukraine, 03143, Ukraine https://orcid.org/0000-0003-1923-6227
  • Tetyana Gordiyenko Odessa State Academy of Technical Regulation and Quality Kovalska str., 15, Odessa, Ukraine, 65020, Ukraine https://orcid.org/0000-0003-0324-9672
  • Maryna Dobrolyubova National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute” Peremohy ave., 37, Kyiv, Ukraine, 03056, Ukraine https://orcid.org/0000-0003-3647-3320

DOI:

https://doi.org/10.15587/1729-4061.2018.139689

Keywords:

comparison of standards, metrological traceability, impedance, national metrological institute, regional metrological organization

Abstract

The equivalence rates of the national standard of a unit of electrical capacitance for denominations of 10 pF and 100 pF at frequencies of 1 kHz and 1.592 kHz and expanded uncertainties obtained from the results of international comparisons of national measurement standards for electrical capacitance units were established and their comparative analysis was carried out. The equivalence of the national standard of the inductance unit for the nominal values of 10 mH and 100 mH at a frequency of 1 kHz and the expanded uncertainties obtained from the results of international additional comparisons of the national measurement standards of inductance units were established and their comparative analysis was carried out. The comparisons were conducted by Regional Metrology Organizations with the participation of the National Metrology Institute of Ukraine.

The analysis of the data processing methods applied in the comparison reports was carried out with the aim of adequately evaluating the results obtained by each of the comparison participants. The results of the National Metrology Institute of Ukraine became the basis for establishing the metrological traceability of measurements of impedance parameters in the country and the recognition of the results of these measurements in other countries.

Values of the expanded uncertainty of the measurements of the electrical capacitance in the range of values from 10 pF to 10 nF for high­precision calibration of the measures of electrical capacitance were calculated. Values of the expanded uncertainty of inductance measurements in the range from 1 µH to 10 H with high­precision calibration of inductance measures were calculated.

The best values of the expanded uncertainty of measurements of impedance parameters (electrical capacitance and inductance) in a wide range of values in Ukraine were established. The comparative analysis showed that the published data on the calibration and measurement capabilities of the national metrology institutes of Ukraine for measuring the electrical capacitance and inductance can be significantly improved in wide ranges of values.

Author Biographies

Oleh Velychko, State Enterprise “All-Ukrainian State Scientific and Production Centre for Standardization, Metrology, Certification and Protection of Consumer”, (SE “Ukrmetrteststandard”) Metrolohychna str., 4, Kyiv, Ukraine, 03143

Doctor of Technical Sciences, Professor, Director

Scientific and Production Institute of Electromagnetic Measurements

Sergii Shevkun, State Enterprise “All-Ukrainian State Scientific and Production Centre for Standardization, Metrology, Certification and Protection of Consumer”, (SE “Ukrmetrteststandard”) Metrolohychna str., 4, Kyiv, Ukraine, 03143

PhD, Head of Department

Department of state standards of electromagnetic quantity, time and frequency

Tetyana Gordiyenko, Odessa State Academy of Technical Regulation and Quality Kovalska str., 15, Odessa, Ukraine, 65020

Doctor of Technical Sciences, Associate Professor, Head of Department

Department of standardization, conformity assessment and quality

Maryna Dobrolyubova, National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute” Peremohy ave., 37, Kyiv, Ukraine, 03056

PhD, Associate Professor

Department of automation of experimental research

References

  1. Measurement comparisons in the context of the CIPM MRA. CIPM MRA-D-05:2013. Available at: http://www.bipm.org/en/cipm-mra/cipm-mra-documents/
  2. The BIPM key comparison database (KCDB). Available at: http://kcdb.bipm.org/
  3. Text of the CIPM MRA. Available at: http://www.bipm.org/en/cipm-mra/cipm-mra-text/
  4. International vocabulary of metrology. – Basic and general concepts and associated terms (VIM 3-rd edition). JCGM 200:2012. Available at: https://www.bipm.org/utils/common/documents/jcgm/JCGM_200_2012.pdf
  5. Velichko O. N. Traceability of measurement results at different levels of metrological work // Measurement Techniques. 2009. Vol. 52, Issue 11. P. 1242–1248. doi: https://doi.org/10.1007/s11018-010-9428-7
  6. ILAC Policy on Traceability of Measurement Results. ILAC Р10:1/2013. Available at: http://www.enao-eth.org/publication_documents/ILAC_P10_01_2013%20ILAC%20Policy%20on%20Traceability%20of%20Measurement%20Results.pdf
  7. Uncertainty of measurement. – Part 3: Guide to the expression of uncertainty in measurement (GUM). JCGM 100:2008. Available at: https://www.bipm.org/en/about-us/
  8. Calibration and Measurement Capabilities in the context of the CIPM MRA. CIPM MRA-D-04:2013. Available at: http://www.bipm.org/en/cipm-mra/cipm-mra-documents/
  9. Velichko, O. N. (2010). Calibration and measurement capabilities of metrological institutes: features of preparation, examination, and publication. Measurement Techniques, 53 (6), 721–726. doi: https://doi.org/10.1007/s11018-010-9567-x
  10. Velychko, O., Gordiyenko, T. (2010). The implementation of general international guides and standards on regional level in the field of metrology. Journal of Physics: Conference Series, 238, 012044. doi: https://doi.org/10.1088/1742-6596/238/1/012044
  11. Cox, M. G. (2002). The evaluation of key comparison data. Metrologia, 39 (6), 589–595. doi: https://doi.org/10.1088/0026-1394/39/6/10
  12. Cox, M. G. (2007). The evaluation of key comparison data: determining the largest consistent subset. Metrologia, 44 (3), 187–200. doi: https://doi.org/10.1088/0026-1394/44/3/005
  13. Mana, G., Massa, E., Predescu, M. (2012). Model selection in the average of inconsistent data: an analysis of the measured Planck-constant values. Metrologia, 49 (4), 492–500. doi: https://doi.org/10.1088/0026-1394/49/4/492
  14. Jeffery, A.-M. (2002). Final report on key comparison CCEM-K4 of 10 pF capacitance standards. Metrologia, 39 (1A), 01003–01003. doi: https://doi.org/10.1088/0026-1394/39/1a/3
  15. Delahaye, F., Witt, T. J. (2002). Linking the results of key comparison CCEM-K4 with the 10 pF results of EUROMET.EM-K4. Metrologia, 39 (1A), 01005–01005. doi: https://doi.org/10.1088/0026-1394/39/1a/5
  16. Johnson, L., Chua, W., Corney, A., Hsu, J., Sardjono, H., Lee, R. D. et. al. (2009). Final report on the APMP comparison of capacitance at 10 pF: APMP.EM-K4.1. Metrologia, 46 (1A), 01003–01003. doi: https://doi.org/10.1088/0026-1394/46/1a/01003
  17. Johnson, L., Chua, W., Corney, A., Hsu, J., Sardjono, H., Lee, R. D. et. al. (2008). Final report on the APMP comparison of capacitance at 100 pF (APMP supplementary comparison APMP.EM-S7). Metrologia, 45 (1A), 01003–01003. doi: https://doi.org/10.1088/0026-1394/45/1a/01003
  18. Velychko, O., Akhamadov, O. (2017). Final report on COOMET key comparison of capacitance at 10 pF (COOMET.EM-K4). Metrologia, 54 (1A), 01005–01005. doi: https://doi.org/10.1088/0026-1394/54/1a/01005
  19. Velychko, O., Akhamadov, O. (2017). Final report on COOMET key comparison of capacitance at 100 pF (COOMET.EM-S4). Metrologia, 54 (1A), 01006–01006. doi: https://doi.org/10.1088/0026-1394/54/1a/01006
  20. Velychko, O., Shevkun, S. (2015). Final report: COOMET supplementary comparison of capacitance at 10 pF and 100 pF (COOMET.EM-S13). Metrologia, 52 (1A), 01005–01005. doi: https://doi.org/10.1088/0026-1394/52/1a/01005
  21. Eckardt, H. (2001). International Comparison of 10 mH Inductance Standards at 1 kHz. CCEM-K3. Final Report. CCEM WGKC/2001-15. PTB, 35.
  22. Kölling, A. (2011). Final report on EUROMET comparison EUROMET.EM-K3: a 10 mH inductance standard at 1 kHz. Metrologia, 48 (1A), 01008–01008. doi: https://doi.org/10.1088/0026-1394/48/1a/01008
  23. Callegaro, L. (2007). EUROMET.EM-S20: Intercomparison of a 100 mH inductance standard (Euromet Project 607). Metrologia, 44 (1A), 01002–01002. doi: https://doi.org/10.1088/0026-1394/44/1a/01002
  24. Dierikx, E., Nestor, A., Melcher, J., Kölling, A., Callegaro, L. (2011). Final report on the supplementary comparison EURAMET.EM-S26: inductance measurements of 100 mH at 1 kHz (EURAMET project 816). Metrologia, 49 (1A), 01002–01002. doi: https://doi.org/10.1088/0026-1394/49/1a/01002
  25. Moreno, J. A., Côté, M., Koffman, A., Castro, B. I., Vasconcellos, R. de B. e, Kyriazis, G. et. al. (2016). SIM.EM-K3 Key comparison of 10 mH inductance standards at 1 kHz. Metrologia, 53 (1A), 01002–01002. doi: https://doi.org/10.1088/0026-1394/53/1a/01002
  26. Velychko, O., Shevkun, S. (2016). Final report on COOMET supplementary comparison of inductance at 10 mH and 100 mH at 1 kHz (COOMET.EM-S14). Metrologia, 53 (1A), 01009–01009. doi: https://doi.org/10.1088/0026-1394/53/1a/01009
  27. Guidelines on COOMET key comparison evaluation. CООМЕТ R/GM/14:2016. Available at: http://www.coomet.org/DB/isapi/cmt_docs/2016/5/2BMD1O.pdf
  28. Guidelines on COOMET supplementary comparison evaluation. CООМЕТ R/GM/19:2016. Available at: http://www.coomet.org/DB/isapi/cmt_docs/2016/5/21XQGO.pdf
  29. EA guidelines on the expression of uncertainty in quantitative testing. EA-04/16G:2003. Available at: http://www.european-accreditation.org/publication/ea-4-16-g-rev00-december-2003-rev
  30. Velychko, O., Shevkun, S. (2017). Support of metrological traceability of capacitance measurements in Ukraine. Eastern-European Journal of Enterprise Technologies, 3 (9 (87)), 4–10. doi: https://doi.org/10.15587/1729-4061.2017.101897
  31. Evaluation of the Uncertainty of Measurement in Calibration. EA-04/02 М:2013. Available at: http://www.european-accreditation.org/publication/ea-4-02-m-rev01--september-2013
  32. Velychko, O., Shevkun, S. (2017). A support of metrological traceability of inductance measurements in Ukraine. Eastern-European Journal of Enterprise Technologies, 5 (9 (89)), 12–18. doi: https://doi.org/10.15587/1729-4061.2017.109750
  33. DSTU ISO/IEC 17025:2006. Zahalni vymohy do kompetentnosti vyprobuvalnykh ta kalibruvalnykh laboratoriy (ISO/IEC 17025:2005, IDT) (2007). Kyiv: Derzhspozhyvstandart Ukrainy, 26.

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Published

2018-07-27

How to Cite

Velychko, O., Shevkun, S., Gordiyenko, T., & Dobrolyubova, M. (2018). Metrological traceability of impedance parameter measurements in Ukraine. Eastern-European Journal of Enterprise Technologies, 4(9 (94), 43–49. https://doi.org/10.15587/1729-4061.2018.139689

Issue

Vol. 4 No. 9 (94) (2018): Information and controlling system

Section

Information and controlling system

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Copyright (c) 2018 Oleh Velychko, Sergii Shevkun, Tetyana Gordiyenko, Maryna Dobrolyubova

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