Effect of Cr2O3 on the bandgap of TiO2 thin films

Authors

  • Віктор Васильович Брус Fedkovich Chernivtsi National University st. Kotsyubinskogo 2, Chernivtsi, Ukraine, 58012, Ukraine
  • Андрій Ігорович Мостовий Fedkovich Chernivtsi National University st. Kotsyubinskogo 2, Chernivtsi, Ukraine, 58012, Ukraine
  • Павло Дмитрович Мар’янчук Fedkovich Chernivtsi National University st. Kotsyubinskogo 2, Chernivtsi, Ukraine, 58012, Ukraine

DOI:

https://doi.org/10.15587/1729-4061.2013.19695

Keywords:

TiO2, Cr2O3, optical properties, doping, envelope method, impurity, band gap, thin film, the absorption coefficient, refractive index

Abstract

Titanium dioxide (TiO2) is a large band gap semiconductor with many interesting properties. This material possesses high refractive index and low absorption coefficient in visible range, which makes it an excellent optical coating material.

Cr2O3 seems to be one of the most promising impurities in TiO2 as it shifts the optical absorption spectrum towards the visible range and improves the photocurrent density of TiO2.

Titanium dioxide thin films doped with chromium oxide (Cr2O3 – 1; 3; mol%) were deposited onto glass substrates in a universal coating system Leybold – Heraeus L560 by electron-beam evaporation.

The transmission spectra of the TiO2 and TiO2 - Cr2O3 thin films were measured by a spectrophotometer SF-2000 within the wavelength range 200 - 1100 nm with a step of 1 nm.

The effect of Cr2O3 concentration on the band gap of titanium dioxide thin films was investigated.

Author Biographies

Віктор Васильович Брус, Fedkovich Chernivtsi National University st. Kotsyubinskogo 2, Chernivtsi, Ukraine, 58012

Candidate of engineering sciences, Assistant professor

Department of Electronics and Energy Engineering

Андрій Ігорович Мостовий, Fedkovich Chernivtsi National University st. Kotsyubinskogo 2, Chernivtsi, Ukraine, 58012

Рostgraduate student 

Павло Дмитрович Мар’янчук, Fedkovich Chernivtsi National University st. Kotsyubinskogo 2, Chernivtsi, Ukraine, 58012

Doctor, Professor, Head of the Department

Department of Electronics and Energy Engineering

References

  1. Brus, V.V. Electrical and photoelectrical properties of photosensitive heterojunctions n-TiO2/p-CdTe [Text] / V. V. Brus, M. I. Ilashchuk, Z. D. Kovalyuk, P. D. Maryanchuk, K. S. Ulyanytsky // Semiconductor Science and Technology. – 2011. – Vol. 26. – 125006.
  2. Barrera, М. Antireflecting–passivating dielectric films on crystalline silicon solar cells for space applications [Text] / M. Barrera, J. Pla, C. Bocchi, A. Migliori // Solar Energy Materials and Solar Cells. – 2008. – Vol. 92, Is. 9. – рр. 1115-1122.
  3. Brus, V.V. Surface–barrier heterojunctions TiO2/CdZnTe [Text] / V.V. Brus, M.I. Ilashchuk, Z.D. Kovalyuk, P.D. Maryanchuk, O.A. Parfenyuk. // Semiconductor Science and Technology. – 2013. – Vol. 28. – 015014.
  4. Jantson,T. Nanocrystalline Cr2O3–TiO2 thin films by pulsed laser deposition [Text] / T. Jantson, T. Avarmaa, H. M¨andar, T. Uustare, R. Jaaniso // Sensors and Actuators. – 2005. – Vol. 109. – pp. 24-31.
  5. Солован, М.Н. Электрические и оптические свойства тонких пленок TiO2 и TiO2:Fe [Текст] / М.Н. Солован, П.Д. Марьянчук, В.В. Брус, О.А. Парфенюк // Неорганические материалы. – 2012. – Том 48, Вип. 10. – С. 1154 - 1160.
  6. Diebold U. The surface science of titanium dioxide [Text] / U. Diebold // Surface Science Reports. – 2003. – Vol. 43. – P. 53-229.
  7. Carp O. Photoinduced reactivity of titanium dioxide [Text] / O. Carp, C.L. Husiman, A. Reller // Progress in Solid State Chemistry. – 2004. – Vol. 32. – P. 33-177.
  8. Jeong S.-H. Charachterization of SiO2 and TiO2 films prepared using rf magnetron sputtering and their application to anti-reflection coatings [Text] / S.-H. Jeong, J.-K. Kim, B.-S. Kim, S.-H. Shim, B.-T. Lee // Vacuum. – 2004. – Vol. 76. – P. 507-515.
  9. Chong L.H. The structural and electric properties of thermally grown TiO2 thin films [Text] / L.H. Chong, K. Mallik, C.H. Groot, R. Kersting // J. Phys: Condens. Matter. – 2006. – Vol. 18. – P. 645-657.
  10. Murakami M. Combinatorial fabrication and characterization of ferromagnetic Ti–Co–O system [Text] / M. Murakami, Y. Matsumoto, M. Nagno, T. Hasegawa, M. Kawasaki, H. Koinuma // Applied Surface Science. – 2004. – Vol. 223. – P. 245-248.
  11. Sanchez-Gonzalez, J. Determination of optical properties in nanostructured thin films using the Swanepoel method [Text] / J. Sanchez-Gonzalez, A. Diaz-Parralejo, A. L. Ortiz // Applied Surface Science. – 2006. – Vol. 252. – pp. 6013-6017.
  12. Мостовий, А. І. Оптичні властивості TiO2:Mn до і після термічної обробки [Текст] / А. І. Мостовий, П. Д. Мар'янчук, В. В. Брус // Східно-Європейський журнал передових технологій. – 2012. – Том. 56, Вип. 2/13. – С. 19-22.
  13. Уханов, Ю. И. Оптические свойства полупроводников [Текст] / Ю. И. Уханов – М.: Наука, 1977. – 368 с.
  14. Brus, V. V. Comparison of optical properties of TiO2 thin films prepared by reactive magnetron sputtering and electron-beam evaporation techniques [Text] / V. V. Brus, Z. D. Kovalyuk, O. A. Parfenyuk, N. D. Vakhnyak // Semiconductor physics, quantum electronics and optoelectronics. – 2011. – Vol. 14(4). – pp. 27-432.
  15. Eiamchai, P. A spectroscopic ellipsometry study of TiO2 thin films prepared by ion-assisted electron-beam evaporation [Text] / P. Eiamchai, P. Chindaudom, A. Pokaipisit, P. Limsuwan // Current Appl. Phys. – 2009. Vol.9. – pp. 707-712.
  16. Brus, V. V., Ilashchuk, M. I., Kovalyuk, Z. D., Maryanchuk, P. D., Ulyanytsky, K. S. (2011). Electrical and photoelectrical properties of photosensitive heterojunctions n-TiO2/p-CdTe. Semiconductor Science and Technology, 26, 125006.
  17. Barrera, М., Pla, J., Bocchi, C., Migliori, A. (2008). Antireflecting–passivating dielectric films on crystalline silicon solar cells for space applications. Solar Energy Materials and Solar Cells, 92(9), 1115-1122.
  18. Brus, V.V., Ilashchuk, M. I., Kovalyuk, Z. D., Maryanchuk, P. D., Parfenyuk, O.A. (2013). Surface–barrier heterojunctions TiO2/CdZnTe. Semiconductor Science and Technology, 28, 015014.
  19. Jantson, T., Avarmaa, T., M¨andar, H., Uustare, T., Jaaniso, R. (2005). Nanocrystalline Cr2O3–TiO2 thin films by pulsed laser deposition. Sensors and Actuators, 109, 24-31.
  20. Solovan, М.М., Maryanchuk, P.D., Brus, V.V., Parfenyuk, O.A. (2012). Electrical and optical properties of thin films of TiO2 and TiO2:Fe. Inorganic Materials, 48(10), 1026-1032.
  21. Diebold U. (2003). The surface science of titanium dioxide. Surface Science Reports, 43, 53-229.
  22. Carp O., Husiman C.L., Reller A. (2004). Photoinduced reactivity of titanium dioxide. Progress in Solid State Chemistry, 32, 33-177.
  23. Jeong S.-H., Kim J.-K., Kim B.-S., Shim S.-H., Lee B.-T. (2004). Charachterization of SiO2 and TiO2 films prepared using rf magnetron sputtering and their application to anti-reflection coatings. Vacuum, 76, 507-515.
  24. Chong L.H., Mallik K., Groot C.H., Kersting R. (2006). The structural and electric properties of thermally grown TiO2 thin films. J. Phys: Condens. Matter, 18, 645-657.
  25. Murakami M., Matsumoto Y., Nagno M., Hasegawa T., Kawasaki M., Koinuma H. (2004). Combinatorial fabrication and characterization of ferromagnetic Ti–Co–O system. Applied Surface Science, 223, 245-248.
  26. Sanchez-Gonzalez, J., Diaz-Parralejo, A., Ortiz, A.L. (2006). Determination of optical properties in nanostructured thin films using the Swanepoel method. Applied Surface Science, 252, 6013-6017.
  27. Mostovyi, A.I., Brus, V.V., Maryanchuk, P. D. (2012). Optical properties of TiO2:Mn before and after thermal treatment. Eastern-European Journal of Enterprise Technologies, 56(2/13), 19-22.
  28. Ukhanov, Yu.I. (1977). Optical Properties of Semiconductors, Moscov: Nauka, 368.
  29. Brus, V. V., Kovalyuk, Z.D., Parfenyuk, O.A., Vakhnyak N.D. (2011). Comparison of optical properties of TiO2 thin films prepared by reactive magnetron sputtering and electron-beam evaporation techniques. Semiconductor physics, quantum electronics and optoelectronics, 14(4), 427-432.
  30. Eiamchai, P., Chindaudom, P., Pokaipisit, A., Limsuwan, P. (2009). A spectroscopic ellipsometry study of TiO2 thin films prepared by ion-assisted electron-beam evaporation Current Appl. Phys, 9. 707-712.

Downloads

Published

2013-12-28

How to Cite

Брус, В. В., Мостовий, А. І., & Мар’янчук, П. Д. (2013). Effect of Cr2O3 on the bandgap of TiO2 thin films. Eastern-European Journal of Enterprise Technologies, 6(12(66), 15–18. https://doi.org/10.15587/1729-4061.2013.19695

Issue

Vol. 6 No. 12(66) (2013): Physical and technological problems of radio engineering devices, telecommunication, nano-and microelectronics

Section

Physical and technological problems of radio engineering devices, telecommunication, nano-and microelectronics

License

Copyright (c) 2014 Віктор Васильович Брус, Андрій Ігорович Мостовий, Павло Дмитрович Мар’янчук

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

The consolidation and conditions for the transfer of copyright (identification of authorship) is carried out in the License Agreement. In particular, the authors reserve the right to the authorship of their manuscript and transfer the first publication of this work to the journal under the terms of the Creative Commons CC BY license. At the same time, they have the right to conclude on their own additional agreements concerning the non-exclusive distribution of the work in the form in which it was published by this journal, but provided that the link to the first publication of the article in this journal is preserved.

A license agreement is a document in which the author warrants that he/she owns all copyright for the work (manuscript, article, etc.).
The authors, signing the License Agreement with TECHNOLOGY CENTER PC, have all rights to the further use of their work, provided that they link to our edition in which the work was published.
According to the terms of the License Agreement, the Publisher TECHNOLOGY CENTER PC does not take away your copyrights and receives permission from the authors to use and dissemination of the publication through the world's scientific resources (own electronic resources, scientometric databases, repositories, libraries, etc.).
In the absence of a signed License Agreement or in the absence of this agreement of identifiers allowing to identify the identity of the author, the editors have no right to work with the manuscript.
It is important to remember that there is another type of agreement between authors and publishers – when copyright is transferred from the authors to the publisher. In this case, the authors lose ownership of their work and may not use it in any way.

Plum Print visual indicator of research metrics
    No metrics available.
see details