The effect of Fe admixture and thermal treatment on optical properties of TiO2 thin films

Authors

  • Михайло Миколайович Солован Fedkovich Chernivtsi National University st. Kotsyubinskogo 2, Chernivtsi, Ukraine, 58012, Ukraine
  • Павло Дмитрович Мар’янчук Fedkovich Chernivtsi National University st. Kotsyubinskogo 2, Chernivtsi, Ukraine, 58012, Ukraine
  • Віктор Васильович Брус Chernivtsi Branch Frantsevich Institute of Problems of Materials Science National Academy of Sciences of Ukraine st. Irene Wilde, 5, Chernivtsi, Ukraine, 58000, Ukraine

DOI:

https://doi.org/10.15587/1729-4061.2012.3383

Keywords:

TiO2, optical properties, alloying, annealing

Abstract

The TiO2:Fe thin films were prepared by the electron-beam evaporation technique, and the influence of alloying and thermal treatment on optical properties of thin films was investigated

Author Biographies

Михайло Миколайович Солован, Fedkovich Chernivtsi National University st. Kotsyubinskogo 2, Chernivtsi, Ukraine, 58012

Рostgraduate student

Павло Дмитрович Мар’янчук, Fedkovich Chernivtsi National University st. Kotsyubinskogo 2, Chernivtsi, Ukraine, 58012

Doctor, Professor, Head of the Department

Department of Electronics and Energy Engineering

Віктор Васильович Брус, Chernivtsi Branch Frantsevich Institute of Problems of Materials Science National Academy of Sciences of Ukraine st. Irene Wilde, 5, Chernivtsi, Ukraine, 58000

Рostgraduate student

References

  1. Diebold U. The surface science of titanium dioxide / U. Diebold // Surface Science Reports. – 43 (2003) 53 – 229.
  2. Sanchez-Gonzalez J. Determination of optical properties in nanostructured thin films using the Swanepoel method / J. Sanchez-Gonzalez, A. Diaz-Parralejo, A. L. Ortiz // Applied Surface Science 252 (2006) 6013-6017
  3. Брус В.В. Визначення оптичних властивостей тонких плівок TiO2 за допомогою конвертного методу/ В.В. Брус – Східно-Європейський журнал передових технологій. 2010. T. 5, N 5(47). С. 13-16. Режим доступу : URL : http://journals.uran.ua/eejet/article/view/3149
  4. Karunagaran B. Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipspmetry / B. Karunagaran, R. T. Rajendra Kumar, C. Viswanathan, D. Mangalaraj // Crystal. Res. Technol. 38 (2003) 773-778.
  5. Eiamchai P. A spectroscopic ellipsometry study of TiO2 thin films prepared by ion-assisted electron – beam evaporation / P. Eiamchai, P. Chindaudom, A. Pokaipisit, P. Limsuwan // Current Applied Physics 9 (2009) 707–712
  6. Уханов Ю. И. Оптические свойства полупроводников / Ю. И. Уханов – М.: Наука, 1977. – 368 с.
  7. Bendavid A. Deposition and modification of titanium dioxide films by
  8. filtered arc deposition / A. Bendavid, P. J. Martin, H. Takikawa // Thin Solid Films 360 (2000) 241.
  9. Lobl P. Nucleation and growth in TiO2 films prepared by sputtering and evaporation / P. Lobl, M. Huppertz, D. Mergel // Thin Solid Films 251 (1994) 72.

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Published

2012-02-01

How to Cite

Солован, М. М., Мар’янчук, П. Д., & Брус, В. В. (2012). The effect of Fe admixture and thermal treatment on optical properties of TiO2 thin films. Eastern-European Journal of Enterprise Technologies, 1(5(55), 36–39. https://doi.org/10.15587/1729-4061.2012.3383

Issue

Vol. 1 No. 5(55) (2012): The applied physics and materials technology

Section

Applied physics

License

Copyright (c) 2014 Михайло Миколайович Солован, Павло Дмитрович Мар’янчук, Віктор Васильович Брус

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